Atomic force microscopy (AFM) is a high-resolution surface analysis technique that allows for 3D topographic imaging at the nanoscale and multiparametric characterization of the mechanical properties ...
The family of electron microscopy techniques have become staple methods for imaging nanoscale objects, including nanoparticles, viruses and proteins. The appeal of electron microscopy as a ...
AFM is commonly used to characterize nanoparticles, which include valuable data related to their qualitative and quantitative properties. For instance, it provides information about the physical ...
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