Fundamentals of Industrial Process, Measurement, and Control (FG05) is a lecture-based course that provides an overview of industrial measurement and control. Technicians, engineers and managers learn ...

This has led to the introduction of the new strategy of Process Window Discovery, Expansion and Control. Fig. 2: Depth of focus budget by design rule. Discovery.

Overlay control based on DI metrology of optical targets has been the primary basis for run-to-run process control for many years. In previous work we described a scenario where optical overlay ...

Process Improvement Tips There are several ways in which your company's NPI process can be improved. One of them is to consider cognitive technologies, which support NPI by providing cross ...

Lattice Semiconductor (NASDAQ: LSCC), the low power programmable leader, today extended its long-standing leadership in control FPGAs with the introdu ...