Chipmakers are using more and different traditional tool types than ever to find killer defects in advanced chips, but they are also turning to complementary solutions like advanced forms of machine ...

Editor’s note: This column was originally published in 2021 and was produced before Gene Wengert died in 2025. It is printed here in memoriam. Q What can you tell me about eliminating machining ...

Intel's 14A manufacturing process is reducing chip defects faster than previous nodes, boosting interest from potential ...

Longitudinal (top) and axial (middle) images of X-Ray CT data of parts with 6 internal defects: a spherical clog, a stellated shaped clog, a cone shaped void, a blob shaped void, an elliptical warp of ...

For the first time, researchers at the Lawrence Berkeley National Laboratory (Berkeley Lab) have built and trained machine learning algorithms to predict defect behavior in certain intermetallic ...

Automated optical inspection (AOI) is a cornerstone in semiconductor manufacturing, assembly and testing facilities, and as such, it plays a crucial role in yield management and process control.

Ceramic materials are renowned for their hardness and high-temperature resistance, making them indispensable in fields such as aerospace, electronics, and biomedical devices. However, these properties ...

Machine learning (ML) has emerged as a powerful tool for studying the properties of condensed matter. To date, most research has focused on the bulk properties of solids, however, defects are ...

This study has shown that image analysis has great potential to provide reliable measurements for defect detection of knitted fabrics. Using the principles of image analysis, an automatic fabric ...

Researchers have developed a new method for detecting defects in additively manufactured components. Researchers at the University of Illinois Urbana-Champaign have developed a new method for ...