Researchers have developed a physics-based technique that accurately measures atomic-scale semiconductor defects, helping ...

Researchers at Sandia National Laboratories and Auburn University have developed a new method to more accurately detect ...

It's been 37 years since scientists first demonstrated the ability to move single atoms, suggesting the possibility of designing materials atom by atom to customize their properties. Today there are ...

Detecting sub-5nm defects creates huge challenges for chipmakers, challenges that have a direct impact on yield, reliability, and profitability. In addition to being smaller and harder to detect, ...

Defect-engineered zinc oxide converts tiny reversible strains into near-infrared light, opening a rare-earth-free path to ...